Method for measuring a capacitance value
US10101862B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 22, 2016 |
| Grant date | Oct 16, 2018 |
| Priority date | — |
| Expiry date | Jan 19, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2217/960725
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for measuring a capacitance value of a capacitive sensor uses an integration process. For the integration process, the sensor is connected to an integration capacitor having a known capacitance value greater than the capacitance value of the sensor and a voltage UCI of the integration capacitor is measured by an A/D converter after a number IZ of executed integration cycles of the integration process. The method includes carrying out the integration process until the number IZ of executed integration cycles has reached the number N of integration cycles to be executed, adding a voltage value UCI (N) of the integration capacitor, which is determined by the A/D converter, to the total voltage value Utotal, increasing the number N, and repeating until the number N exceeds a predetermined value. The final total voltage value Utotal is indicative of the capacitance value of the capacitive sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.