Method and apparatus to detect LO leakage and image rejection using a single transistor
US10103757B2 · kind B2 · utility
1Cited by
5References
26Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 25, 2015 |
| Grant date | Oct 16, 2018 |
| Priority date | — |
| Expiry date | Aug 25, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B2001/0408
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Local oscillator (LO) leakage and Image are common and undesirable effects in typical transmitters. Typically, fairly complex hardware and algorithms are used to calibrate and reduce these impairments. A single transistor that draws essentially no dc current and occupies a very small area detects the LO leakage and Image signals. The single transistor operating as a square-law device is used to mix the signals at the input and output ports of a power amplifier. The mixed signal generated by the single transistor enables the simultaneous calibration of the LO leakage and Image Rejection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.