Selecting scanning voltages for dual energy CT scanning
US10105110B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 18, 2015 |
| Grant date | Oct 23, 2018 |
| Priority date | — |
| Expiry date | Jan 23, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05G1/58
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method and apparatus for selecting high and low energy scanning voltages for a dual energy CT scanner are provided. The method may comprise: setting a criterion of selection for selecting high and low energy scanning voltages; generating combinations of high and low energy scanning voltages according to all scanning voltages supported by a dual energy CT scanner, wherein each of the combinations may comprise a high energy scanning voltage and a low energy scanning voltage; and selecting a combination of high and low energy scanning voltages from the generated combinations of high and low energy scanning voltages based on the criterion of selection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.