Material testing apparatus and method
US10107731B2 · kind B2 · utility
0Cited by
6References
35Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 14, 2012 |
| Grant date | Oct 23, 2018 |
| Priority date | — |
| Expiry date | Sep 25, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K13/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of operating a material testing apparatus comprises conducting a test by applying a fluctuating load to a material specimen at a variable test frequency, measuring the temperature of the specimen during application of the load, and varying the test frequency on the basis of the measured temperature whereby to prevent the specimen from exceeding a predetermined maximum temperature during the test. A corresponding material testing apparatus is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.