System and method for deforming and analyzing particles

US10107735B2 · kind B2 · utility

Assignee

• The Regents of the University of California · US

Inventors

• Dino Di Carlo · Los Angeles, US
• Daniel R. Gossett · Los Angeles, US
• Henry T.K. Tse · San Francisco, US
• Aram Chung · Seoul, KR

Key dates

• Filing date: Dec 13, 2016
• Grant date: Oct 23, 2018
• Expiry date: Dec 13, 2036

Classification

• Technology area (CPC G): Physics
• CPC primary: G06T7/0016
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A system for deforming and analyzing particles includes a substrate defining an inlet, and an outlet; a fluidic pathway fluidly coupled to the inlet and the outlet and defining a delivery region upstream of a deformation region configured to deform particles, wherein the fluidic pathway comprises a first branch configured to generate a first flow, and a second branch configured to generate a second flow that opposes the first flow, wherein an intersection of the first flow and the second flow defines the deformation region; a detection module including a sensor configured to generate a morphology dataset characterizing deformation of the particles, and a photodetector configured to generate a fluorescence dataset characterizing fluorescence of the particles; and a processor configured to output an analysis of the plurality of particles based at least in part on the deformation dataset and the fluorescent dataset for the plurality of particles.