Method and device for estimating optical properties of a sample
US10107745B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Apr 21, 2017 |
| Grant date | Oct 23, 2018 |
| Priority date | — |
| Expiry date | Apr 21, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/088
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and a device allow optical properties of a sample to be estimated. The method includes the illumination of the sample by a first light source, and the formation of an image of the sample thus illuminated, on the basis of which a first optical property is estimated, at various points on a surface of the sample. The method also includes measuring an auxiliary optical property of the sample and estimating the first optical property, taking account of the auxiliary optical property measured on the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.