Test method for secondary battery
US10107863B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 24, 2013 |
| Grant date | Oct 23, 2018 |
| Priority date | — |
| Expiry date | Feb 4, 2034 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P70/50
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A test method for a secondary battery, which early detects the occurrence of the future micro short-circuiting in the screening and promotes to render the contaminant harmless while suppressing the short-circuiting between the positive and negative electrodes in the aging, is provided. This test method includes Step S12 of charging the secondary battery, Steps S13 and S14 of aging the secondary battery in a first pressed state, Step S17 of measuring a battery voltage (V1) after the aging, Step S18 of screening the secondary battery in a second pressed state with a higher pressure than in the first pressed state, and Step S19 of measuring a battery voltage (V2) after the screening. Whether the battery has the internal short-circuiting or not is determined (Step S20) based on the difference between the voltage (V1) measured in Step S17 and the voltage (V2) measured in Step S19.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.