Time to digital converter with increased range and sensitivity
US10108148B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 14, 2017 |
| Grant date | Oct 23, 2018 |
| Priority date | — |
| Expiry date | Apr 14, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG04F10/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods are provided for converting time measurements to digital value representing phase. Such systems and methods use a ring oscillator to create a coarse measurement of the time difference between first and second rising edges of a modulated signal. A two-dimensional Vernier structure is used to create a fine resolution measurement of the error in the coarse measurement. The coarse and fine measurements are combined to calculate a digital time measurement. A digital time output is calculated as the difference in successive digital time measurements. An offset digital time output is calculated as a difference in a digital time output in relation to a carrier period offset. The offset digital time output is scaled and accumulated to calculate the integrated time signal. The integrated time signals are synchronized to the carrier frequency to output a series of final phase measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.