RF testing system
US10110325B2 · kind B2 · utility
3Cited by
9References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 27, 2015 |
| Grant date | Oct 23, 2018 |
| Priority date | — |
| Expiry date | Apr 27, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/29
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
An integrated circuit (IC) is provided. The IC includes an RF transmitter configured to generate an RF signal in response to a command signal from test equipment; an RF receiver configured to generate an evaluation signal according to the RF signal, and report the evaluation signal to the test equipment, so that the test equipment performs a test analysis on the evaluation signal to determine a test result, wherein the test equipment is external to the IC.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.