High/low temperature contactless radio frequency probes
US10114040B1 · kind B1 · utility
2Cited by
14References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 17, 2014 |
| Grant date | Oct 30, 2018 |
| Priority date | — |
| Expiry date | May 31, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01Q13/106
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A contactless radio frequency (RF) probe with inverted microstrip lines. The RF probe includes a microstrip associated with a device under test, and a broadside coupled inverted microstrip line configured to exchange RF signals to a network analyzer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.