Patent · US Active

High/low temperature contactless radio frequency probes

US10114040B1 · kind B1 · utility

2Cited by
14References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 17, 2014
Grant dateOct 30, 2018
Priority date
Expiry dateMay 31, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01Q13/106
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

A contactless radio frequency (RF) probe with inverted microstrip lines. The RF probe includes a microstrip associated with a device under test, and a broadside coupled inverted microstrip line configured to exchange RF signals to a network analyzer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.