Patent · US Active

Estimating similarity of nodes using all-distances sketches

US10115115B2 · kind B2 · utility

2Cited by

4References

19Claims

0Family size

Assignee

MICROSOFT TECHNOLOGY LICENSING, LLC · US

Inventors

Renato F. Werneck · San Francisco, US
Moises Goldszmidt · Palo Alto, US
Andrew V. Goldberg · Redwood City, US
Edith Cohen · Berkeley Heights, US
Daniel Delling · Mountain View, US
Fabian Fuchs · Cleebronn, DE

Key dates

Filing date	Sep 16, 2014
Grant date	Oct 30, 2018
Priority date	—
Expiry date	Nov 30, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG06Q50/01
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

One or more all-distances sketches are generated for nodes in a graph. An all-distances sketch for a node includes a subset of the nodes of the graph, and a shortest distance between the node and each of the nodes in the subset of nodes. The generated all-distances sketches are used to estimate the closeness similarity of nodes. The estimated closeness similarity can be used for targeted advertising or for content item recommendation, for example.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.