Method for calibrating absolute responsivity of terahertz quantum well detector and device thereof

US10119860B2 · kind B2 · utility

Assignee

• SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY CHINESE ACADEMY OF SCIENCES · CN

Inventors

• Zhiyong Tan · Shanghai, CN
• Juncheng Cao · Shanghai, CN
• Li GU · Chongqing, CN
• Yonghao Zhu · Lo Wu, CN

Key dates

• Filing date: Apr 30, 2014
• Grant date: Nov 6, 2018
• Expiry date: Jan 4, 2035

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J2001/083
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A calibration method for an absolute responsivity of a terahertz quantum well detector and a calibration device thereof, in which the device at least comprises: a driving power supply, a single frequency laser source, an optic, a terahertz array detector, a terahertz dynamometer, a current amplifier and an oscilloscope. The calibration method adopts a power detectable single frequency laser source as a calibration photosource, to obtain the absolute responsivity parameters of the detector at the laser frequency; a normalized photocurrent spectrum of the detector is used to further calculate the absolute responsivity parameters of the detector at any detectable frequency. the single frequency laser source with periodically output is adopted as a calibration photosource, the terahertz array detector and the dynamometer are adopted to directly measure and obtain the incident power of the calibrated detector.