Test pattern and method for calibrating an X-ray imaging device
US10119922B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 30, 2016 |
| Grant date | Nov 6, 2018 |
| Priority date | — |
| Expiry date | Feb 17, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/303
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test pattern geometrically calibrates an x-ray imaging device to generate three-dimensional images of an object by reconstruction based on two-dimensional projections of the object, the calibrating test pattern comprising a volume support with markers having a radiological absorbance providing contrast to the volume support, the markers distributed in a three-dimensional pattern, in subsets substantially in parallel respective straight lines wherein sequences of cross-ratios are constructed from the respective subsets of markers. Each sequence of cross-ratios comprises a single cross-ratio for each quadruplet of markers in which quadruplet the markers are ordered depending on rank number of respective markers along the straight line they are aligned in a predefined first direction, the order being common to all cross-ratios. When a subset of markers comprises at least five markers, the order of the cross-ratios in the respective sequences of cross-ratios is defined by a rule common to all sequences of cross-ratios.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.