Patent · US Active

High impedance compliant probe tip

US10119992B2 · kind B2 · utility

0Cited by

36References

17Claims

0Family size

Assignee

Tektronix, Inc. · US

Inventors

William A. Hagerup · Portland, US
Julie A. Campbell · Beaverton, US
Ira G. Pollock · Beaverton, US
James E. Spinar · Sandy, US
Kathleen F. M. Ullom · West Linn, US
Charles M. Hartmann · Forest Grove, US
Daniel J. Ayres · Warren, US
Christina D. Enns · Beaverton, US

Key dates

Filing date	Apr 1, 2015
Grant date	Nov 6, 2018
Priority date	—
Expiry date	Aug 14, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/06733
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element coupled with the plunger component at one end and with the tip component at the opposite end, the resistive/impedance element including at least one rod having a semi-cylindrical form and a resistive material situated thereon.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.