Enabling testing of an integrated circuit at a single temperature
US10120017B2 · kind B2 · utility
2Cited by
6References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 15, 2016 |
| Grant date | Nov 6, 2018 |
| Priority date | — |
| Expiry date | Mar 8, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2856
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In one aspect, an integrated circuit (IC) includes an output port enabling measurement of a performance characteristic of the IC at a first temperature. The performance characteristic of the IC is a minimum value at the first temperature with respect to any other temperature. The first temperature may be room temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.