Thermal non-contact voltage and non-contact current devices
US10120021B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 16, 2017 |
| Grant date | Nov 6, 2018 |
| Priority date | — |
| Expiry date | Jul 26, 2037 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY04S10/40
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods detect abnormal conditions in electrical circuits by providing thermal imaging combined with non-contact measurements of current and voltage. Such systems may be implemented in a single test device, or in wired combinations, or in wireless communication implementations with multiple test devices and/or accessories, or in combination with one or more additional devices, such as a mobile phone, tablet, personal computer (PC), cloud-based server, etc. A thermal imaging tool that includes an infrared sensor may first discover and image one or more thermal anomalies in an object, such as an electrical circuit. One or more non-contact current or voltage sensors may be used to measure current and/or voltage, which allows for determination of the power loss at the measured location. The power loss may be used to determine an estimation of the abnormal resistive power losses in a circuit, as well as the costs associated therewith.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.