Systems and methods for light beam position detection
US10120214B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 24, 2016 |
| Grant date | Nov 6, 2018 |
| Priority date | — |
| Expiry date | Feb 14, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10052
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed herein are techniques for determining the position of a light beam on a beam shaping device. A feature can be formed on the beam shaping device to affect at least a portion of a light beam when the feature is illuminated by the light beam. When the light beam is directed onto the feature on the beam shaping device, a feature detection signal may be generated by a detector in response to detecting at least the portion of the light beam affected by the feature that has been illuminated by the light beam. The position of the light beam on the beam shaping device at a time instant can then be determined based, at least in part, on the feature detection signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.