Method for enhancing optical signal-to-noise ratio measuring precision by correcting spectral resolution
US10122445B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 20, 2016 |
| Grant date | Nov 6, 2018 |
| Priority date | — |
| Expiry date | Dec 7, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/07957
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A method for enhancing optical signal-to-noise ratio measuring precision by correcting spectral resolution is provided, which can obtain optical signal-to-noise ratio with enhanced measuring precision, by measuring actual power of broad spectrum signals in a certain bandwidth, determining the sum of the power of the sampling points for the broad spectrum signals in the bandwidth by using an optical spectrum analyzer, obtaining the corrected resolution of the optical spectrum analyzer, and replacing the setting resolution of the optical spectrum analyzer with the corrected resolution. The method can effectively solve the problem of large OSNR measuring error resulted from the difference between the setting resolution and the actual resolution of optical spectrum analyzer. The method is applicable to correct resolution for all optical spectrum analyzers, and also applicable to enhance the measuring precision for all OSNR measuring methods based on spectrum analysis, and has the advantages of easiness to handle and implement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.