Process and device for measuring intermodulation products by reflection of electromagnetic waves on an object
US10126341B2 · kind B2 · utility
0Cited by
2References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 24, 2015 |
| Grant date | Nov 13, 2018 |
| Priority date | — |
| Expiry date | Dec 16, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01Q19/19
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A process and a device for measuring intermodulation products by wave reflection on a non-linear object (20), including two electromagnetic sources (24, 25) of distinct focal points emitting fundamental components, and a receiver (28), the process includes a step in which the measuring device is in a configuration so that the receiver (28) produces a signal for a first composition of the enriched wave (23), and a second step in which the measuring device is in a second configuration so that the receiver (28) produces a measuring signal for a second composition of the enriched wave (23).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.