Methods of thermally induced recrystallization
US10128052B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 3, 2017 |
| Grant date | Nov 13, 2018 |
| Priority date | — |
| Expiry date | Aug 3, 2037 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E10/549
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method for thermally induced recrystallization of a film having a perovskite structure can include exposing the perovskite structure to a liquid phase induction atmosphere sufficient to at least partially liquefy the film. The substrate with the film can be heated while in the atmosphere to a heating temperature above a critical recrystallization temperature until the film recrystallizes to reform the perovskite structure with reduced defects and increased grain size. The liquid phase induction atmosphere can be purged, and the substrate with the film having the reformed perovskite structure can be allowed to cool. The film having the perovskite structure can have a formula ABX3, (RA)2An−1BnX3n+1, or (RA2)An−1BnX3n+1, where A is a monovalent cation, B is divalent metal cation, n is an integer, X is a halide ion, RA is an alkylammonium cation and RA2 is an alkyldiammonium cation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.