Gradient light interference microscopy for 3D imaging of unlabeled specimens
US10132609B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 15, 2017 |
| Grant date | Nov 20, 2018 |
| Priority date | — |
| Expiry date | Nov 15, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/008
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and methods for quantitative optical phase imaging of a sample. First second replica field of an image field are generated, characterized by a respective optical phase, cross-polarized and shifted in a shift direction transverse to a normal to the surface of the sample. The replica fields are Fourier transformed, the second replica field is retarded by four successive phase shifts, and, after inverse Fourier transforming, the first and second replica fields pass through an analyzer polarizer and superposing the first and second replica fields on a detector array to create four successive detector signals. The four successive detector signals are solved to derive a gradient of the optical phase of the image field, which may be integrated to obtain a quantitative phase image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.