System and method for reconstructing the surface topography of an object embedded within a scattering medium
US10132764B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 13, 2017 |
| Grant date | Nov 20, 2018 |
| Priority date | — |
| Expiry date | Nov 13, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/616
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods of reconstructing the surface topography of an object embedded in a scattering medium are provided, with example methodologies including: imaging an object embedded in a signal scattering medium using a scattered signal detector; detecting changes in the magnitude of a plurality of scattered signals obtained from multiple fields of view within the medium; and constructing an image of the surface topography of the object based on said plurality of detected signal magnitude changes. A plurality of system, apparatus, control means, evaluation methods, and materials and components useful for practicing the methods are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.