System and method for testing a material system
US10139337B2 · kind B2 · utility
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14References
21Claims
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Key dates
| Filing date | Feb 6, 2014 |
| Grant date | Nov 27, 2018 |
| Priority date | — |
| Expiry date | Mar 16, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0282
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for testing a material system may include a support structure for mounting the material system, and a electromechanical device operably connected to the support structure, wherein the electromechanical device applies an electromechanical-induced force to the material system, and wherein the electromechanical-induced force causes a displacement in the material system equivalent to material displacement from thermal stress in significantly less time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.