X-ray multigrain crystallography
US10139357B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 4, 2016 |
| Grant date | Nov 27, 2018 |
| Priority date | — |
| Expiry date | Jan 20, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/606
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is method of determining one or more unit cells of a polycrystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.