Control marker for implementing analysis methods on spots
US10139404B2 · kind B2 · utility
3Cited by
1References
5Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 8, 2015 |
| Grant date | Nov 27, 2018 |
| Priority date | — |
| Expiry date | Apr 8, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2458/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to the use of a control marker for implementing analysis methods on spots, in particular in the context of multiplex analyses. The present invention thus relates to solid supports containing said control marker, their preparation method and their use in analysis methods. The present invention makes it possible to verify the presence, location and/or integrity of the spots at the end of the analysis method, and thus to secure the obtained results while guaranteeing that the yielded result indeed results from a present, intact and localized spot.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.