Automatic test system with focused test hardware
US10139449B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 26, 2016 |
| Grant date | Nov 27, 2018 |
| Priority date | — |
| Expiry date | Jun 11, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2221/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A tester interface unit comprising a test hardware module. The test hardware module may have a simple construction, relying on control and/or signal processing in one or more tester instruments to generate or analyze test signals for a device under test. The test hardware module may be disposed within the tester interface unit, providing a short and high integrity signal path length to the device under test. The tester interface unit may include a purge gas chamber and a cooling chamber, with the hardware module penetrate a separator between those chambers, sealing an opening between the purge gas chamber and the cooling chamber. A heat spreader may move heat generated on the portion of the test hardware module in the purge gas chamber to the cooling chamber.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.