Multi-radiation identification and dosimetry system and method
US10139496B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 9, 2015 |
| Grant date | Nov 27, 2018 |
| Priority date | — |
| Expiry date | Feb 14, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T7/00
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A multi-radiation identification and dosimetry system and method that allows for monitoring of alpha, beta, and gamma radiation is disclosed. The system/method incorporates a segmented silicon drift detector (SSDD) that allows measurement of directly absorbed radiation in the semiconductor (betas, conversion electrons, Lx lines, and alphas) on one SSDD segment and radiation from a radiation scintillation detector (RSD) on multiple segments of the SSDD. With the anode side of the SSDD directed toward the radiation inspection surface (RIS), the SSDD+RSD stacked radiation detector collects radiation which is processed by a charge sensitive amplifier (CSA) and then processed by a time stamping differentiator (TSD). A computing control device (CCD) may be configured to collect the time stamp differentiation data from the various SSDD segments to permit the simultaneous discrimination of several types of radiation by and presentation of these radiation types and counts on a display monitor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.