Self-calibration of force sensors and inertial compensation
US10139959B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 26, 2013 |
| Grant date | Nov 27, 2018 |
| Priority date | — |
| Expiry date | Mar 19, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/0447
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of calibrating a force sensor that includes an input surface and an array of sensing elements. The input has a number of test locations and is deformable under applied force. The force sensor is mounted in a predetermined test orientation. For each test location of the plurality of test locations on the input surface of the force sensor a predetermined test force to the test location. An element calibration value is measured for each sensing element of the array of sensing elements of the force sensor. An (x, y) deformation map of the input surface of the force sensor corresponding to the application of the predetermined test force to the test location is determined based on the measured element calibration values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.