Method for characterising a sample by mass spectrometry imaging
US10141168B2 · kind B2 · utility
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Key dates
| Filing date | Feb 22, 2017 |
| Grant date | Nov 27, 2018 |
| Priority date | — |
| Expiry date | Feb 22, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/03
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a method for characterizing a sample by mass spectrometry imaging (MSI) according to which a spatial arrangement of at least one ion in the sample is characterized from imaging data associated with the ion, in terms of morphology and/or texture.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.