System and method for LADAR-based optic alignment and characterization
US10145944B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 4, 2015 |
| Grant date | Dec 4, 2018 |
| Priority date | — |
| Expiry date | Dec 27, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03F7/70591
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical alignment system includes a LADAR sub-system including: a laser source and a probe configured to deliver probe illumination from the laser source to a first optical surface of the optical system and an additional optical surface of the optical system. The probe is further configured to receive a first measurement signal from the first optical surface and an additional measurement signal from the additional optical surface of the optical system. The system also includes a detector configured to receive a first combined signal and an additional combined signal from an optical coupling assembly. The system further include a controller configured to determine a relative distance between the first optical surface and the additional optical surface based on the first combined signal or the additional combined signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.