Bad block detection and predictive analytics in NAND flash storage devices
US10146604B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 23, 2016 |
| Grant date | Dec 4, 2018 |
| Priority date | — |
| Expiry date | May 27, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/81
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Utilities for use in actively detecting the occurrence of bad blocks in NAND flash storage devices and diagnosing the devices as faulty at some point before complete failure of the devices (e.g., before a number of allowable bad blocks has been reached) to allow a corresponding service processor to continue to write to available blocks for a period of time until a replacement NAND flash device can be identified. The utilities may also be utilized to predict the future occurrence of bad blocks in NAND flash devices, such as during the “burn-in” process of the devices (e.g., which tests the quality of the NAND flash device before being placed into service to weed out devices with defects).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.