Storage array testing
US10146826B1 · kind B1 · utility
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16Claims
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Key dates
| Filing date | Dec 28, 2015 |
| Grant date | Dec 4, 2018 |
| Priority date | — |
| Expiry date | Nov 10, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F16/285
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In one aspect, a method includes receiving samples of data generated from a storage array related to a performance parameter; determining, for each sample, whether a sample is anomaly; and determining, for each sample identified as an anomaly, whether the anomaly should be reclassified to a spike or a drop.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.