Patent · US Active

Calculating normalized metrics

US10152302B2 · kind B2 · utility

1Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 12, 2017
Grant dateDec 11, 2018
Priority date
Expiry dateMar 6, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F17/18
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Examples relate to calculating normalize metrics. The examples disclosed herein calculate respective normalized first metric values for each of a plurality of first metric values that are on a time scale and respective normalized second metric values for each of the plurality of raw second metric values that are on the time scale, where the plurality of first metric values are associated with a first metric, and the plurality of second metric values are associated with a second metric. An extremum of the normalized first metric value and the normalized second metric value at each time of the time scale is averaged to calculate a plurality of extremum baseline values. Examples herein calculate a plurality of sleeve values of the plurality of extremum baseline values based on a standard deviation of the plurality of extremum baseline values.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.