Illumination and imaging device for high-resolution X-ray microscopy with high photon energy
US10153062B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jun 27, 2016 |
| Grant date | Dec 11, 2018 |
| Priority date | — |
| Expiry date | Feb 4, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K1/062
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to an illumination and imaging device for high-resolution X-ray microscopy with high photon energy, comprising an X-ray source (1) for emitting X-ray radiation and an area detector (4) for detecting the X-ray radiation. Moreover, the device comprises a monochromatizing and two-dimensionally focussing condenser-based optical system (2) arranged in the optical path of X-ray radiation with two reflective elements (6) being arranged side-by-side for focussing impinging X-ray radiation on an object to be imaged (5) and a diffractive X-ray lens (3) for imaging the object to be imaged (5) on the X-ray detector (4). Typically, the illumination and imaging device is used for performing radiography, tomography and examination of a micro-electronic component or an iron-based material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.