Patent · US Active

Concept for determining a measure for a distortion change in a synthesized view due to depth map modifications

US10154245B2 · kind B2 · utility

1Cited by
1References
20Claims
0Family size

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Key dates

Filing dateDec 11, 2017
Grant dateDec 11, 2018
Priority date
Expiry dateDec 11, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04N13/128
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

An apparatus for determining a measure for a distortion change of a first view synthesized from a second view, caused by a modification of a depth map of the second view from a first state to a second state, is configured to compute a possible successor synthesis state corresponding to a synthesis of the first view from the second view having the depth map modified to the second state in an already processed portion plus a currently processed portion and having the depth map unmodified at the first state in the yet to be processed portion without the currently processed portion; and to determine a distortion change of a distortion of the current synthesis state of the first view relative to an undistorted version of the first view to a distortion of the possible successor synthesis state of the first view relative to the undistorted version of the first view.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.