Subband-based modulation tester
US10154422B2 · kind B2 · utility
2Cited by
0References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 11, 2016 |
| Grant date | Dec 11, 2018 |
| Priority date | — |
| Expiry date | Feb 2, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L27/2601
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
Methods and systems are disclosed which allow testing essential performance parameters of broadband communications systems, while using test channels of lower bandwidth, allowing thus lower cost hardware (or use of legacy test system). In particular, the methods and systems allow testing of EVM in digital systems, especially OFDM systems. The methods and systems readily apply to test equipment for production lines, such as IC testers of final product testers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.