Electron microscopy sample support including porous metal foil
US10157725B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 12, 2014 |
| Grant date | Dec 18, 2018 |
| Priority date | — |
| Expiry date | Oct 24, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/26
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Some embodiments are directed to an electron microscopy sample support including: a support member; and a metal foil including a porous region. The support member is configured to give structural stability to the metal foil, and the porous region of the metal foil is configured to receive an electron microscopy sample. Also disclosed is a method of manufacturing such an electron microscopy sample support, a method of imaging using such an electron microscopy sample support and an apparatus operable to perform such imaging. The disclosed microscopy specimen support reduces particle motion and/or sample charging in electron microscopy, and thus improve information available from electron micrographs. Appropriately designed and constructed supports may lead to an increased resolution per particle and increased accuracy of angular assignments in 3D reconstructions of, for example, biological specimens, enabling the determination of structures of smaller and more difficult proteins than was previously possible using EM techniques.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.