Correction of an x-ray image for effects of an anti-scatter grid
US10159452B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 19, 2017 |
| Grant date | Dec 25, 2018 |
| Priority date | — |
| Expiry date | Jun 14, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N17/002
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for correction of an x-ray image recorded with an x-ray device with an anti-scatter grid for effects of the anti-scatter grid is provided. The anti-scatter grid has a spatially periodically repeating geometrical embodiment, and a calibration image recorded without an imaging object is used. The calibration image and the x-ray image are transformed by a transformation into the position frequency space. In the position frequency space, adaptation parameters describing changes of the calibration image optimizing a measure of matching between the x-ray image and the calibration image are established. For correction, the adapted calibration image is subtracted from the x-ray image, and the x-ray image is transformed back into the position space again using an inverse of the transformation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.