Patent · US Active

Method of forming wiring pattern and etching apparatus for forming wiring pattern

US10161055B2 · kind B2 · utility

1Cited by
1References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 31, 2016
Grant dateDec 25, 2018
Priority date
Expiry dateAug 22, 2036

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C18/30
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A method of forming a wiring pattern includes: a) forming a metal underlayer including a first underlying wiring layer which is in contact with an electrode, a second underlying wiring layer which is not in contact with the electrode, and an underlying connection layer which connects the first underlying wiring layer to the second underlying wiring layer; b) forming a metal plating layer on the metal underlayer through electroplating; and c) removing a metal connection portion through etching. The metal connection portion is the underlying connection layer covered with the metal plating layer. The etching includes bringing a solid electrolyte material that contains a solution into which metal of the metal connection portion is dissolved, into contact with the metal connection portion and applying a voltage between the metal connection portion and the solid electrolyte material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.