Spectrophotometer diagnosis
US10161794B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 29, 2015 |
| Grant date | Dec 25, 2018 |
| Priority date | — |
| Expiry date | May 21, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/524
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectrophotometer diagnosis system and a method for diagnosing a spectrophotometer, wherein at least one test patch is printed in proximity to at least one non-printed substrate patch, at least one value characteristic of the at least one test patch and/or the at least one substrate patch is measured using the spectrophotometer, and at least one diagnostic score for the spectrophotometer is determined based on the at least one measured value in comparison with a reference value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.