Method for characterization of photonic devices, and associated device
US10161830B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 16, 2017 |
| Grant date | Dec 25, 2018 |
| Priority date | — |
| Expiry date | Mar 16, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/07
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An intermediate signal is separated into a first sub-signal and a second sub-signal according to a separation coefficient having a known real value. The first sub-signal is delivered to a first photonic circuit containing at least one photonic device to be characterized and a first photonic part. The second sub-signal is delivered to a second photonic circuit containing a second photonic part having a same transfer function as the first photonic part but lacking the at least one photonic device. Optical output signals from the first and second photonic circuits are converted into first and second electrical signals. Losses of the at least one photonic device are determined from processing the electrical signals and from the known real value of the separation coefficient.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.