Method for tracing distribution of moving ions in ion mobility spectrometer
US10161904B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 12, 2017 |
| Grant date | Dec 25, 2018 |
| Priority date | — |
| Expiry date | Apr 12, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/6402
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for tracing a distribution of moving ions in an ion mobility spectrometer is provided, including steps: first selecting a sample having light-emitting characteristics as a tracing sample; subsequently, ionizing the tracing sample by using an ionization source, and feeding ions of the tracing sample to a drift tube of the ion mobility spectrometer; using a plate to collect the ions at a cross section to be detected; and finally processing the ions collected on the plate by using an appropriate means, thereby enabling the ions to emit light, and displaying a distribution view of movement positions of the ions on the cross section. By combining a light-emitting tracing means and movements of charged ions in an ion mobility spectrometer, it is able to master a position distribution of the charged ions in the ion mobility spectrometer more intuitively and practically.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.