Tuning a testing apparatus for measuring skew
US10162002B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 20, 2015 |
| Grant date | Dec 25, 2018 |
| Priority date | — |
| Expiry date | Jul 20, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31727
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments herein discuss tuning a testing apparatus to better match the input response of a target system in which a cable will be used. For example, conductors in the cable may have a different skew depending on the system in which they are used. The testing apparatus may be tuned using frequency information regarding the type of signals that will be driven on the cable when installed in the target system. In one embodiment, the testing apparatus uses the frequency information to configure a programmable clock source that can be used to shape a reference clock and control a driver to match the signals in the target system. Using the clock source to modify the reference clock results in the driver outputting a testing signal that better reflects the actual signals that will be transmitted on the cable in the target system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.