Patent · US Active

Determining of a spatial distribution of the electrical contact resistance of an electrochemical cell

US10162012B2 · kind B2 · utility

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Key dates

Filing dateSep 21, 2016
Grant dateDec 25, 2018
Priority date
Expiry dateSep 21, 2036

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02E60/50
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method for determining a spatial distribution (Rcx,yf) of a parameter of interest (Rc) representative of a contact resistance between a bipolar plate and an adjacent electrode of an electrochemical cell, in which a spatial distribution (Rcx,yf) of the parameter of interest (Rc) is determined depending on the spatial distribution (Qx,ye) of a second thermal quantity (Qc) estimated beforehand from the spatial distribution (Tx,yc) of a set-point temperature (Tc) and from the spatial distribution (Dx,yr) of a first thermal quantity (Dr).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.