Method for linearizing attenuation measurements taken by a spectrometry sensor
US10162069B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 2, 2015 |
| Grant date | Dec 25, 2018 |
| Priority date | — |
| Expiry date | May 9, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T11/005
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
The invention relates to a method for linearizing attenuation measurements obtained by means of a direct conversion spectrometer. The spectrometer comprises a radiation source and a detector for detecting said radiation after it has passed through an object. An attenuation measurement is represented by a vector Md giving the attenuation of the radiation in a plurality Nk of energy channels of the detector, said spectrometer being characterized by a response matrix Ψ. Said method estimates, by means of an iterative process, a vector Mlin, called an equivalent linear attenuation vector, giving for each energy channel an attenuation linearly depending on the thickness of the material through which the radiation passes. Said method is applicable to the characterization of the material as well as to the reduction of artifacts in computed tomography.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.