Patent · US Active

Optical system with a frustrated isotropic block

US10162087B2 · kind B2 · utility

1Cited by
5References
21Claims
0Family size

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Key dates

Filing dateApr 10, 2017
Grant dateDec 25, 2018
Priority date
Expiry dateApr 10, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B27/4233
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An optical system configured as part of optical metrology unit used to assess the operational status of a workpiece and, in a specific case, configured as an encoder head of a lithographic exposure tool. The optical system is devoid of a stand-alone optical corner-cubes and includes, instead, a single, imperfect or frustrated cuboid of optically-isotropic material that, in operation with the diffraction grating of the workpiece, simultaneously forms four interferometric signals for measuring x-, y, and z-positions of the workpiece grating relative to the optical system. Proposed system and method solve problems of (i) structural complexity of a conventional metrology unit for use in an exposure tool, (ii) burdensome alignment of the multitude of optical prisms in the process of forming such metrology unit, and (iii) cyclic non-linear errors associated with measurements involving conventional corner-cubes-based metrology units.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.