Anisotropic conductive film cutting calibration system and method
US10163032B2 · kind B2 · utility
0Cited by
5References
20Claims
0Family size
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Key dates
| Filing date | May 25, 2016 |
| Grant date | Dec 25, 2018 |
| Priority date | — |
| Expiry date | Jan 10, 2037 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB29L2031/3406
- WIPO fieldOther special machines
- WIPO sectorMechanical engineering
Abstract
An anisotropic conductive film (ACF) cutting calibration system and method are disclosed, and the system includes: a cutter, configured to cut the ACF; an image acquisition device, configured to collect a cutting mark image of the ACF according to a predetermined period; a processing device, configured to compare the cutting mark image with a predetermined image, so as to determine an offset of a cutting mark in the cutting mark image with respect to a cutting mark in the predetermined image; and a drawing device, configured to draw the ACF and adjust a speed of drawing the ACF.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.