Patent · US Active

Error detection in recognition data

US10163038B2 · kind B2 · utility

2Cited by

4References

8Claims

0Family size

Assignee

SAP SE · DE

Inventors

Ke Wang · New York, US
Yinling Ni · Shanghai, CN
Ling Tony Chen · Bellevue, US
Ye Jin · Shanghai, CN
Qiwei Zhang · Shanghai, CN
Jing Liu · Tuji, CN
Xin Li · Beijing, CN
Chao Yu · Ningbo City, CN

Key dates

Filing date	Dec 24, 2015
Grant date	Dec 25, 2018
Priority date	—
Expiry date	Aug 12, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG06V20/625
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Described herein is a descriptive framework to facilitate error detection in recognition data. In accordance with one aspect of the framework, at least one erroneous record is detected in a first set of recognition data. The framework may determine a correction of a first recognized identifier in the erroneous record by searching a second set of recognition data for a matching record with a second recognized identifier substantially similar to the first recognized identifier. A report may then be generated to present the detected erroneous record and the determined correction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.