Patent · US Active

Method and device for defect-size evaluation

US10168301B2 · kind B2 · utility

2Cited by

0References

20Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Rainer Böhm · Rietz-Neuendorf, DE
Karl Fendt · Birkenfeld, DE
Werner Heinrich · Prenzlau, DE
Hubert Mooshofer · Birkenfeld, DE

Key dates

Filing date	May 7, 2014
Grant date	Jan 1, 2019
Priority date	—
Expiry date	Jan 3, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG01S15/8997
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and a device for defect-size evaluation of defects in a test object in ultrasonic testing is provided. In particular, the method and device also allows systematic determination of defect sizes based on the SAFT method. This is done by simulating defects in a test object on the basis of a defined test scenario, and comparing these simulations with actually recorded measured values.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.