Patent · US Active

Test and measurement probe with adjustable test point contact

US10168356B2 · kind B2 · utility

3Cited by

2References

13Claims

0Family size

Assignee

Tektronix, Inc. · US

Inventors

Julie A. Campbell · Beaverton, US
William A. Hagerup · Portland, US
Ira G. Pollock · Beaverton, US

Key dates

Filing date	Aug 19, 2015
Grant date	Jan 1, 2019
Priority date	—
Expiry date	Nov 18, 2036

Classification

Technology area (CPC H)Electricity
CPC primaryH01R2201/20
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A probe for making electrical contact with a device-under-test test point includes a body, a rigid member capable of travelling linearly with respect to the body, a flexible arm having a test point contact at one end and fastened to the rigid member at the other end, and a flexible linkage fixed to the body and to the flexible arm. The flexible linkage is structured to cause the flexible arm to bend in response to travel of the rigid member in one direction, and to cause the flexible arm to unbend in response to travel of the rigid member in the other direction. A second flexible arm may be included, the two arms opening and closing to change the distance between test point contacts. A light source may be disposed on a portion of the flexible linkage that simultaneously articulates to automatically track the orientation of the test point contact.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.